INTRODUCING STANDARD SAMPLES FOR ATOMIC FORCE MICROSCOPY
Atomic force microscopy (AFM) is a microscopic method for visualization of surfaces with high-resolution and for studies of local materials’ properties.
Posted June 19, 2018
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Posted July 21, 2024
Sergey Belikov's passing
Life can be very disappointing, especially when losing friends, family members, and companions. We knew Sergey and greatly appreciated him as a remarkable scientist with deep knowledge, experience, and background in many disciplines. Our interactions were very fruitful. The terrible news of Sergey Belikov's recent passing, our friend and coworker for many years, shocked and saddened us. He had kept his health condition from us, so this was more unexpected. We offer our sincere condolences to his family on this occasion.
SPM Labs News
Posted April 04, 2018